Are you looking for answers or would you like to exchange ideas on that topic?
Meet Postnova Analytics GmbH’s experts Florian Meier and Roland Drexel at our poster at the Analytica conference at the ICM in Munich (free entrance for Analytica ticket holders), or at the Postnova booth in Hall A1, Booth 314.
Poster title:
Tackling the challenges in nanoplastic characterization – from appropriate reference materials, complex matrices, and (too?) low concentrations
To read the full abstract, go to Analytica Conference and enter SHT03.
